Customer Case Studies

Challenge

Low manual inspection efficiency and high missed defect rate for micro-defects on SMT production lines.

Solution

Deploy AOI (Automated Optical Inspection) equipment for fully automated, high-speed inspection.

Achievements

• 300% increase in detection efficiency
• Miss rate reduced to 0.1%
• Save 200K in labor costs annually

Challenge

Micron-level defects on wafer surfaces are difficult to detect, impacting yield.

Solution

Custom 3D visual inspection solutions with accuracy up to 0.1 μm

Achievements

• Yield increased by 15%
• Capacity increased by 200%
• Customer Satisfaction 98%

Challenge

Strict appearance inspection standards for parts; manual inspection lacks consistency.

Solution

End-to-end quality control system ensuring zero-defect delivery

Achievements

• Defect detection rate: 99.95%
• Customer complaints reduced by 80%
• IATF 16949 certified